Compact analytical SEM for fast, high-quality imaging and EDS in materials science, QA/QC, and education.

Tescan VEGA Compact delivers high-resolution imaging and integrated EDS in a simplified, space-efficient system. With intuitive Tescan Essence™ software and a large chamber that accommodates industrial-scale samples, it’s the ideal choice for reliable, everyday materials analysis—today and in the future.

Tungsten filament SEM platform for reliable, low-cost imaging and analysis in QA/QC and education.

Tescan VEGA offers high-resolution imaging and integrated EDS in a compact, aperture-less SEM system optimized for ease of use. With Wide Field Optics™ and minimal training requirements, it enables fast navigation and operation for everyday materials analysis.

Modular FEG-SEM platform for analytical research and failure analysis with scalable detector integration.

Tescan MIRA delivers high-current, high-resolution imaging with Schottky FEG optics and support for EDS, EBSD, CL, STEM, and nanoprototyping. Its modular design and upgrade options make it suitable for evolving lab needs in research and QA/QC.

High-performance UHR SEM platform with integrated EDS for shared labs and quality control environments.

MIRA XR combines BrightBeam™ UHR optics, Wide Field Optics™, and Dual Essence™ EDS for seamless high-resolution imaging and live compositional analysis. Optimized for diverse users, it handles charging, non-conductive, and outgassing samples with confidence.

Field-free UHR SEM platform for high-contrast imaging of delicate and non-conductive materials.

Tescan CLARA provides sub-nanometer resolution imaging with BrightBeam™ optics and customizable detection. Designed for sensitive materials, it supports flexible multimodal workflows and in-situ experiments with exceptional contrast at low keV.

TriLens™ immersion SEM platform optimized for contrast-critical nanoscale imaging and STEM-in-SEM analysis.

Tescan MAGNA leverages TriLens™ immersion optics and energy-selective detectors to deliver crisp, unmixed contrast at high resolution—even at long working distances or on tilted surfaces. Designed for cross-sections, nanomaterials, and advanced failure analysis.

Automated mineralogy platform for quantitative particle-by-particle analysis in geoscience and mineral processing.

Tescan TIMA combines high-throughput SEM-EDS with automated mineral identification and textural analysis to deliver reproducible, quantitative mineralogical data at scale. With integrated correlative imaging (BSE, EDS, CL) and fully automated workflows, TIMA supports exploration, process optimization, and academic research—without manual interpretation or user bias.