TESCAN VEGA COMPACT is an entry-level yet powerful analytical SEM engineered for routine materials characterization, quality control, failure analysis, and research at the micron scale. Featuring a tungsten electron source, aperture-less optics with Intermediate Lens™ powered by In-Flight Beam Tracing™, Wide Field Optics™ for live SEM overview, and fully integrated Essence™ EDS, VEGA COMPACT combines imaging and elemental analysis in a single software window to accelerate time-to-data.

TESCAN VEGA is an analytical scanning electron microscope (SEM) for routine materials characterization, research, and quality control at the micron scale. With a tungsten filament electron source, Intermediate Lens™ powered by In-Flight Beam Tracing™, Wide Field Optics™, and optionally integrated Essence™ EDS, VEGA combines SEM imaging and live elemental analysis in a single software window to accelerate time-to-data.

TESCAN MIRA is a high-resolution analytical scanning electron microscope (SEM) designed for routine materials characterization, research, and quality control at the sub-micron scale. With an efficient Schottky FEG, Intermediate Lens™ powered by In-Flight Beam Tracing™, and optional fully integrated Essence™ EDS, MIRA combines SEM imaging and live elemental analysis in a single workflow for faster time-to-data.

TESCAN MIRA XR is a high-throughput, ultra-high-resolution analytical FE-SEM for materials science, QA/QC and research labs. It combines an efficient detector layout, Wide Field Optics™ for live SEM overview, and In-Flight™ automated controls to minimize manual re-alignment and accelerate time-to-data. With Dual Essence™ EDS fully integrated in the live SEM window, users can switch seamlessly between imaging and analytical conditions.

TESCAN CLARA is a field-free ultra-high-resolution scanning electron microscope (UHR SEM) designed for comprehensive nanoscale surface analysis of any material. With its BrightBeam™ SEM column, selective multi-detector system, and Essence™ software interface, CLARA delivers exceptional contrast, automation, and analytical versatility — from materials science to life and earth sciences.

TESCAN MAGNA is an ultra-high-resolution (UHR) field emission scanning electron microscope (FE-SEM) built upon the innovative Triglav™ column with TriLens™ immersion optics. It delivers sub-nanometer imaging at low kV and full analytical performance, ideal for advanced materials science, semiconductors, and nanotechnology.

TESCAN TIMA is an Automated Mineralogy analyzer purpose-built for Earth science and mineral processing. It automatically identifies and quantifies minerals using algorithm-driven or user-defined rules with a built-in mineralogical database. With up to four integrated EDS detectors and TESCAN’s high-sensitivity spectral summing algorithm, TIMA delivers ultra-fast, trustworthy data and can also double as a high-performance FE-SEM for imaging and microanalysis when needed.