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Focus Ion Beam Scanning Electron Microscopy (FIB-SEM)

Advanced FIB-SEM
for Insight and Impact

Precision, versatility, and unmatched performance, designed to meet the challenges of both routine and complex workflows. Whether you're working in materials science, life sciences,
or semiconductors, Tescan’s FIB-SEM systems provide more than high-resolution imaging. They give you the control to cut, shape, 
and analyze structures with nanoscale accuracy. 
From focused Ga-ion beams for fine detail to Xe plasma beams for fast volume processing, our modular platforms adapt to your needs. Combined with intuitive software and expert support, we help you move confidently from question to insight.

Tescan AMBER 2 - Focused Ion Beam Scanning Electron Microscopes Ga FIB-SEM

Tescan AMBER 2 - Focused Ion Beam Scanning Electron Microscopes Ga FIB-SEM

Automated Ga⁺ FIB-SEM platform for high-precision TEM sample prep and nanoscale prototyping.

Tescan AMBER integrates BrightBeam™ field-free SEM optics with the Orage™ Ga⁺ FIB and fully automated lamella workflows. Designed for versatility, it supports inverted and planar sample prep, nanoprototyping, and gentle final polishing across a wide range of material types.

Tescan AMBER X 2 - Focused Ion Beam Scanning Electron Microscopes Plasma FIB-SEM

Tescan AMBER X 2 - Focused Ion Beam Scanning Electron Microscopes Plasma FIB-SEM

Universal Plasma FIB-SEM platform for fast, damage-free sample preparation and 3D multimodal analysis.

AMBER X 2 combines Mistral™ Xe Plasma FIB with BrightBeam™ UHR SEM to handle both large-volume sectioning and delicate TEM lamella prep. It supports multimodal workflows, including EDS, EBSD, ToF-SIMS, and Raman, across hard, soft, or beam-sensitive materials.

Tescan SOLARIS 2 - Focused Ion Beam Scanning Electron Microscopes Ga FIB-SEM

Tescan SOLARIS 2 - Focused Ion Beam Scanning Electron Microscopes Ga FIB-SEM

Dedicated Ga⁺ FIB-SEM for automated, high-precision TEM sample prep in semiconductor applications.

TESCAN SOLARIS is a fully automated sample prep platform optimized for advanced devices with sub-10 nm features. It integrates the Triglav™ SEM, AutoTEM Pro™ software, and OptiLift™ nanomanipulator to enable hands-free, repeatable lamella prep in planar, inverted, or top-down geometries.

Tescan SOLARIS X 2 - Focused Ion Beam Scanning Electron Microscopes Plasma FIB-SEM

Tescan SOLARIS X 2 - Focused Ion Beam Scanning Electron Microscopes Plasma FIB-SEM

Plasma FIB-SEM platform for high-throughput semiconductor failure analysis and Ga-free sample prep.

SOLARIS X 2 combines Mistral™ Xe Plasma FIB and UHR SEM imaging with artifact-free Rocking Stage cross-sectioning and SEM-guided targeting. Designed for modern failure analysis labs, it supports fast defect localization, Xe-based TEM prep, and processing of complex stacks and packaging.

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