Webinars

Powering the Future: Unveiling Battery Electrode Secrets with AFM-in-SEM

Powering the Future: Unveiling Battery Electrode Secrets with AFM-in-SEM

Join us to explore How AFM-in-SEM is revolutionizing battery research and materials analysis.
Speaker: Ms. Veronika Hegrová - Application Manager (NenoVision)

In Situ and Dynamic Imaging with TESCAN Micro-CT

In Situ and Dynamic Imaging with TESCAN Micro-CT

TESCAN is pushing the boundaries of materials characterization with dynamic micro-CT imaging. By capturing the evolution of materials in real-time, we enable researchers to gain deeper insights into material behaviour under various conditions. Advancements in micro-CT imaging have enabled scientists to understand and observe fluid migration in complex geological materials such as soils and reservoirs. The TESCAN dynamic micro-CT systems, in particular, have provided new insights into the subsurface world by bringing real-time pore-scale imaging from synchrotrons to the lab.
Speaker: PhD. Marijn Boone (Product Marketing Manager for micro-CT at TESCAN Group)

 Atom Probe Tomography

Enhancing Atom Probe Tomography – Precision Preparation with TESCAN FIB-SEM

Join our upcoming webinar to explore how TESCAN’s Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) technology enhances Atom Probe Tomography (APT) specimen preparation.  

For scientists and researchers focused on atomic-scale materials analysis, mastering the intricacies of APT specimen preparation is essential. In this online session in cooperation with Cameca Instruments, you’ll learn how TESCAN’s FIB-SEM systems enable precise preparation with minimal sample damage, essential for achieving accurate and reliable results in APT analysis.  

Webinar Title: FIB-SEMs: A Critical Tool for Precision in Atom Probe Tomography (APT) 

Status: Waiting the Recorded Video

FIB-SEM Microscopy

FIB-SEM Microscopy Introduction to Semicon FA and R&D

The continuous drive for miniaturization, efficiency, and integration in semiconductor devices is pushing boundaries in both design and manufacturing. As a result, the challenges faced by researchers and engineers in failure analysis (FA) and sample preparation are more complex than ever.
For professionals working in this space, having reliable and efficient tools to prepare and analyze samples is critical to maintaining progress. This is why we invite you to our upcoming webinar to explore our suite of FIB-SEM solutions, designed specifically for semiconductor FA and R&D laboratories.
In this online session, we’ll be walking through the role these systems play in sample preparation workflows, highlighting how precision, automation, and ease of use can boost your lab’s productivity.

Title: FIB-SEM Microscopy Introduction to Semicon FA and R&D

Status: Recorded Video is available for reviewing

AMBER 2 and AMBER X 2

A 4-Part Webinar Series by TESCAN and WAS (AMBER 2 and AMBER X 2)

TESCAN is thrilled to announce a series of four informative webinars exploring the latest advancements in materials analysis technology. These online events, held in collaboration with Wiley Analytical Science (WAS), will showcase the capabilities of our newest FIB-SEM systems, Plasma FIB-SEM AMBER X 2 and Ga FIB-SEM AMBER 2.

Status: Recorded Video is available for reviewing

Automated large-area Plasma FIB delayering & in-situ nanoprobing of the most current semiconductor devices

Automated large-area Plasma FIB delayering & in-situ nanoprobing of the most current semiconductor devices

Join us for webinar that promises to bring new insights to semiconductor device analysis. Organized jointly by TESCAN Group and Imina Technologies, this session will delve into innovative methods for automated large-area Plasma FIB delayering and in-situ nanoprobing of advanced semiconductor devices.

Speakers:
Lukas Hladik, Ph.D., Product Marketing Manager (TESCAN Group)
Guillaume Boetsch, Co-founder of Imina Technologies

Status: Recorded Video is available for reviewing