Experience how MIRA XR's advanced capabilities transform your analysis workflows in real-time demonstrations. Connect with Tescan experts to discover practical applications that enhance your research and quality control processes.

Speaker: Tomáš Borůvka
Product Marketing Manager – SEM Solutions in Materials Science at Tescan. Drawing on his background in R&D, he brings together user perspective and technical understanding.

Webinar description

Tescan MIRA XR combines ultra-high-resolution SEM-EDS with BrightBeam™ technology to deliver reliable results for researchers and quality control teams. This system provides consistent imaging performance across nanoscale research and industrial applications.

This webinar shows how MIRA XR streamlines analysis workflows while maintaining precision. You'll see real applications that demonstrate faster sample-to-results workflows and enhanced reproducibility.

Webinar Highlights

• How MIRA's optimized BrightBeam™ technology delivers high-resolution imaging across diverse sample types.

• Real-world examples of accelerated analysis and improved measurement reproducibility.

• Integrated Dual Essence™ elemental mapping within the SEM interface for seamless workflows.

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