Transmission Electron Microscopy TEM

Transmission Electron Microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Delong Instruments and Delong America belong Delong Group. Delong operations in the high tech, engineering design, manufacturing and sales sectors. Transmission Electron Microscopy is a Delong's highlight product line.

Delong's TEM also has the same origin
Brno City - Czech Republic,

The place is also referred to as
the “Mecca of Electron Microscopy”

LVEM5 Benchtop Electron Microscopy

LVEM5 Benchtop Electron Microscopy

LVEM5 Benchtop Electron Microscope
The LVEM5 is the only benchtop Transmission Electron Microscopy, and the first instrument built on the revolutionary LVEM platform. A true benchtop instrument, available with TEM, SEM, STEM and ED imaging modes.

LVEM25 Electron Microscopy

LVEM25 Electron Microscopy

LVEM25 Electron Microscope

The LVEM25 is the newest and most powerful Low Voltage Electron Microscopy, built on an enhanced technology platform and designed to work with conventionally prepared samples.

LVEM Installations Map