Introduction to TESCAN TIMA
TIMA accelerates time to actionable mineralogical insight by automating grain detection, mineral classification and quantification. High-resolution BSE imaging is tightly correlated with elemental maps and optional cathodoluminescence in a single run, while automation scripts support unattended operation and remote/offline analysis for continuous throughput and reproducibility.
Typical Applications
- Mineral processing & metallurgy: modal mineralogy, liberation/locking, mineral associations for process optimization.
- Exploration & ore characterization: mineral deportment, bright-phase search for precious/critical phases.
- Academic Earth science: petrography, phase mapping, texture and grain size distributions.
- Correlative studies: correlate BSE, EDS maps and CL within a single workflow.
- General SEM tasks: use TIMA as a high-performance FE-SEM when not running automated mineralogy.
Key Features
Ultra-fast Automated Mineralogy
- Up to 4× integrated EDS operating simultaneously for higher throughput and fine-grain resolution.
- Spectral summing algorithm improves sensitivity for low-abundance and light elements.
- Automated mineral ID and quantification using built-in database and rule-based classification.
Robust Electron Optics
- Schottky field emitter; 200 eV–30 keV (down to 50 eV with BDT option).
- Intermediate Lens™ electromagnetic aperture control for spot optimization across probe currents.
- Magnification 2×–1,000,000×; probe current 2 pA–400 nA (continuous).
Integrated Workflows & Reliability
- Correlate high-resolution BSE, EDS maps and CL in a single run.
- Automation scripts for unattended operation and rapid turnaround with minimal operator time.
- Optional UniVac (variable pressure) extends sample compatibility (1–700 Pa).
TIMA & Essence™ Software
- TIMA Online for acquisition & processing; TIMA Offline (2 licenses included) for post-processing.
- Analytical modules: Modal Analysis, Liberation Analysis, Bright Phase Search.
- Essence™ SEM platform: customizable UI, presets, multi-user layouts, Undo/Redo, multi-channel live imaging.
Representative Technical Specifications
| Specification | Value (representative) |
|---|---|
| Electron source | Schottky field emitter |
| Landing energy | 200 eV–30 keV (down to 50 eV with BDT) |
| Probe current | 2 pA–400 nA (continuous) |
| Resolution (HV / LV) | HV: 1.2 nm @ 30 keV (SE); 3.5 nm @ 1 keV (In-Beam SE)* • LV: 2.0 nm @ 30 keV (BSE) |
| Magnification | 2×–1,000,000× |
| Vacuum modes | High vacuum; optional UniVac 1–700 Pa |
| Detectors (examples) | SE (E-T), retractable BSE, In-Beam SE/BSE*, LV detectors*, CL detectors* |
| Integrated EDS | 2× EDS standard (30 mm²); up to 4× EDS total; 129 eV @ Mn Kα |
*Specifications may vary depending on configuration and installed options.
FAQ
How does TIMA identify and quantify minerals automatically?
Using a built-in mineralogical database with algorithm-generated or user-defined rules and simultaneous EDS data acquisition.
How many EDS detectors can TIMA use?
Up to four integrated EDS detectors operate in parallel to increase throughput and spatial resolution.
Does TIMA support unattended and offline workflows?
Yes. Automation scripts enable unattended runs; TIMA Offline provides remote post-processing and reporting.
Can TIMA be used as a standard SEM?
Yes. When not running automated mineralogy, TIMA functions as a high-performance FE-SEM for imaging and microanalysis.
Overview of TESCAN TIMA
TESCAN TIMA combines robust FE-SEM optics, up to four integrated EDS, and dedicated Automated Mineralogy software modules to deliver rapid, reproducible petrographic and process-relevant data—reducing operator burden while increasing confidence in decision-making.
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