TESCAN CLARA – Field-Free Ultra-High-Resolution SEM with BrightBeam™ Technology

Introduction to TESCAN CLARA
Typical Applications
Key Features
Representative Technical Specifications
FAQ
Overview of TESCAN CLARA
Related Video/Webinar
Contact & Support

Introduction to TESCAN CLARA

The TESCAN CLARA features TESCAN’s BrightBeam™ SEM column that employs a combined electrostatic–magnetic objective lens for field-free ultra-high-resolution imaging at low beam energies. This unique optical design reduces aberrations and minimizes charging artifacts, ensuring outstanding performance for all sample types — conductive, non-conductive, and beam-sensitive alike.

Typical Applications

Nanomaterials & catalysts: nanoparticles, coatings, nanofibers, and porous structures.
Metals & alloys: microstructure analysis, grain boundary studies, EBSD/EDS mapping.
Beam-sensitive or insulating materials: stable low-kV imaging with optional MultiVac™.
Biological samples: low-vacuum or cryo observation of cells, tissues, and microorganisms.
Geological samples: mineral morphology, elemental mapping, and cathodoluminescence.

Key Features

BrightBeam™ Field-Free Column

Combined electrostatic–magnetic objective ensures field-free imaging and reduced aberrations at low beam energies.
Ultra-high resolution down to 0.9 nm @ 15 keV and 1.2 nm @ 1 keV (BDT).

Selective Multi-Detector System

Dual in-column detectors (Axial & Multidetector) plus Everhart-Thornley (E-T) for simultaneous SE/BSE collection.
Energy- and angle-filtered BSE imaging for optimized topographic and compositional contrast.

MultiVac™ Variable Pressure Mode

Operates between 7–500 Pa (N₂/H₂O) for charge mitigation in insulating or outgassing samples.
Includes Gaseous Secondary Electron Detector (GSD) for beam-sensitive materials.

In-Flight™ Automation & Essence™ Software

Automatic focus, stigmation, brightness/contrast, and beam tracing for fast, stable imaging.
Essence™ GUI with modular design, guided workflows, and real-time 3D collision model.

Optional Integrated Tools

ONCam optical navigation camera, RISE™ Raman, tensile/heating stages, or Serial Block Face Imaging (SBFI).

Representative Technical Specifications

Parameter	Specification
Electron source	Schottky field emission gun
Resolution (HV)	0.9 nm @ 15 keV • 1.2 nm @ 1 keV (BDT)
Accelerating voltage	50 eV – 30 keV
Probe current	2 pA – 400 nA (continuous)
Vacuum modes	High vacuum <1×10⁻³ Pa; MultiVac™ 7–500 Pa
Magnification	2× – 2,000,000×
Stage (5-axis)	X–Y: 130 mm, Z: 100 mm, Tilt: -70° to +90°, Rotation: 360°
Software	TESCAN Essence™ (SharkSEM™, Image Snapper, etc.)

*Specifications may vary depending on installed options and configuration.

FAQ

What makes CLARA different from other SEMs?
CLARA offers field-free UHR imaging using the BrightBeam™ column with dual in-column detection and optional MultiVac™, ideal for diverse materials.

Can it image beam-sensitive or non-conductive samples?
Yes, MultiVac™ enables imaging under low-vacuum conditions (7–500 Pa) with charge compensation.

Does CLARA support analytical tools?
Yes, it is fully compatible with EDS, EBSD, WDS, and optional Raman or SBFI modules.

Overview of TESCAN CLARA

TESCAN CLARA combines field-free BrightBeam™ optics, selective signal detection, and advanced automation to deliver fast, accurate, and reproducible nanoscale imaging for materials, biological, and geological research. It empowers users to achieve high-resolution, high-contrast results from any sample type.