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Introduction to TESCAN TENSOR
Unlike traditional TEM systems that often require expert-level operational skills, TESCAN TENSOR redefines the user experience with intuitive operation. This device makes performing diffraction analysis and 4D-STEM mapping as simple and fast as conventional SEM imaging or EDX elemental mapping.
Typical Applications
Thanks to its multi-modal analysis capabilities and superior data processing speeds, TESCAN TENSOR is a powerful tool in many high-tech fields:
- Materials Science: Researching crystal structures, phase orientation, and grain boundaries of new materials, thin films, and nanoparticles.
- Semiconductor Technology: Strain analysis in semiconductor components with extreme precision, helping to optimize processor chip performance.
- Energy and Batteries: Analyzing microstructural changes and chemical compositions of electrode materials during charge/discharge cycles.
- Nano-Crystallography (3D-ED): Determining the atomic structure of ultra-small crystal samples where X-ray techniques are not applicable.
- Failure Analysis: Quickly identifying structural defects or chemical impurities in the manufacturing process.
Outstanding Features
TESCAN TENSOR possesses pioneering technologies that set new standards for analytical STEM series:
- Integrated Beam Precession: With speeds up to 72,000 Hz, this feature reduces dynamical effects and improves accuracy in phase and strain mapping.
- On-the-fly Processing: Utilizing the Explore™ software platform, it allows for real-time observation of 4D-STEM analysis results while the sample is being scanned.
- Full Automation (Automated Alignments): The system automatically aligns the electron column and lenses, ensuring that every operator achieves consistent and highly repeatable results.
- Near-UHV Environment: The sample chamber design achieves ultra-high vacuum levels, minimizing carbon contamination on the sample surface.
- Perfect Synchronization: The combination of a Schottky FEG electron source, high-speed beam blanker, and the DECTRIS QUADRO direct electron detector allows for simultaneous acquisition of diffraction and EDS data at every pixel.
Frequently Asked Questions (FAQ)
1. What makes 4D-STEM on TESCAN TENSOR different?
Typically, 4D-STEM requires complex systems and offline data processing. TENSOR integrates the entire workflow—from beam control to real-time processing—making 4D data acquisition as easy as EDX.
2. Can an SEM operator use the TENSOR?
Yes. With a user-centric design philosophy, TESCAN TENSOR eliminates complex manual alignment steps, allowing those familiar with SEM to master the device quickly.
3. What is the resolution of the device?
At an accelerating voltage of 100 kV, TESCAN TENSOR achieves a STEM resolution of approximately 0.28 nm, ensuring exceptional detail for nanomaterial analysis applications.
TESCAN TENSOR Overview
TESCAN TENSOR is not just a STEM microscope; it is a comprehensive analytical platform that bridges the gap between data acquisition and research decision-making. By combining advanced features such as high-speed beam precession, intelligent automation, and real-time data processing, TENSOR delivers maximum productivity for both academic and industrial research environments.
It is the ideal solution for organizations seeking a powerful, accurate nano-structural analysis tool that remains user-friendly and highly productive.
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