English (UK)

PortableRL - Bruker Alicona

PortableRL- Mobile, high resolution measurement


 IF-PortableRL is an optical 3D measurement system for quality assurance of micro structured surfaces. Users verify measure- ment fields of up to (mm) 50x50x26. The system is applied for both curved and flat components. A battery pack allows a flexible use and mobile positioning, enabling the use of the sys-tem wherever needed. A large vertical scanning range allows the measurement of various geometry types and forms. Amongst others, fields of use are platen inspection, asphalt measurement, quality assurance of turbine or rotor blades, 3D measurement of steel and body parts.

 

 

 

 

 

 

 

 

 

 

GENERAL SPECIFICATIONS

Positioning volume (X x Y x Z): 50 mm x 50 mm x 25 mm = 62500mm³

OBJECTIVE SPECIFIC FEATURES:

Objective magnification   10x 20x 50x 2xSX 4xAX* 5xAX 10xAX 20xAX 50xSX  
Working distance mm 17.5 16 10.1 34 30 34 33.5 20 13  
Lateral measurement range (X,Y) mm 2 1 0.4 10 4.87 3.61 2 1 0.4  
(X x Y) mm² 4 1 0.16 100 23.72 13.03 4 1 0.16  
Vertical resolution nm 150 75 50 3500 620 460 170 90 70  
Height step accuracy (1 mm) % 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1  
Min. measurable roughness (Ra) µm 0.55 0.25 0.2 --- --- --- 0.65 0.3 0.25  
Min. measurable roughness (Sa) µm 0.30 0.15 0.1 --- --- --- 0.35 0.15 0.13  
Min. measurable radius µm 5 3 2 20 12 10 5 3 2  

 

 ACCURACY

Flatnessdeviation 2 mm x 2 mm with 10x objective U = 0.1 µm
Max. deviation of a
height step measurement		 heightstep1000μm
heightstep100μm
heightstep10μm
heightstep1μm		 E Uni: St: ODS, MPE = 1 µm, σ= 0.1 µm
E Uni: St: ODS, MPE = 0.4 µm, σ= 0.05 µm
E Uni: St: ODS, MPE = 0.3 µm, σ= 0.025 µm
E Uni: St: ODS, MPE = 0.15 µm, σ= 0.01 µm
Profile roughness Ra = 0.5 µm U = 0.04 µm, σ= 0.002 µm
Area roughness Sa = 0.5 µm U = 0.03 µm, σ= 0.002 µm
Distance measurement XY up to 2 mm E Bi: Tr: ODS, MPE = 0.8 µm
Wedge angle β= 70-110 º U = 0.15 º, σ= 0.02 º
Edge radius R = 5 µm - 20 µm
R > 20 µm		 U = 1.5 µm, σ= 0.15 µm
U = 2 µm, σ= 0.3 µm