Scanning Electron Microscope SEM

Tescan MAGNA - Scanning Electron Microscopes SEM

Tescan MAGNA - Scanning Electron Microscopes SEM

TriLens™ immersion SEM platform optimized for contrast-critical nanoscale imaging and STEM-in-SEM analysis.

Tescan MAGNA leverages TriLens™ immersion optics and energy-selective detectors to deliver crisp, unmixed contrast at high resolution—even at long working distances or on tilted surfaces. Designed for cross-sections, nanomaterials, and advanced failure analysis.