AFM brings new inside-to-SEM method of characterisation, enabling the analysis of a broad range of properties:

TESCAN MultiVac - Reveal the finest topographic details from insulating, beam sensitive and outgassing samples, in low vacuum and without conductive surface coating.

TESCAN Nanomanipulator - Smooth, predictable movement and easy operation from within TESCAN Essence

TESCAN TRUE X-Sectioning - Time-saving method for ripple-free plasma FIB cross-sectioning without sacrificing high beam current

ONCam is TESCAN’s latest innovation that enhances sample navigation and provides correlative macro-imaging

Selecting the right BSE detector for characterizing your samples

TESCAN Essence™ DrawBeam - Expandable software module for high precision nanopatterning and nanofabrication applications

TESCAN Essence™ EBL Kit - Add powerful, multipurpose nanoprototyping capabilities to your TESCAN SEM and FIB-SEM system

TESCAN AutoSlicer™ - Robust and reliable semi-automated TEM sample preparation

TESCAN Rocking Stage - Seamlessly leverage the advantages of high current milling on TESCAN Plasma FIB instruments

TESCAN 3D Volume Analysis - Processing and 3D visualization of multi-channel FIB-SEM tomography data

TESCAN FIB-SEM Tomography - Automated high-resolution serial sectioning, imaging and data collection made easy