TESCAN MAGNA - UHR SEM for nanomaterials characterization at sub-nanometer scale
TESCAN CLARA - Field-free analytical UHR SEM for materials characterization at the nanoscale
TESCAN MIRA - High-resolution analytical SEM for routine materials characterization, research and quality control applications at the sub-micron scale
TESCAN VEGA Compact for routine materials characterization, research and quality control applications at the micron scale
TESCAN VEGA - Analytical SEM for routine materials characterization, research and quality control applications at the micron scale
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