Scanning Electron Microscopy is a well-known non-destructive technique that uses an electron beam probe to analyse samples surface down to nano-scale. The scanning electron microscopes produce high magnification images with high resolution, a feature of which makes them suitable tools for a wide range of applications in numerous fields of science and industry.
TESCAN SEM Solutions for Materials Science
Scanning Electron Microscopy has become an essential tool for materials science and engineering. TESCAN offers an extended portfolio of turnkey systems, tailored to help scientists and researchers in materials science make progress and achieve their goals. TESCAN’s broad range of dedicated and innovative instruments is part of our firm commitment to push materials science forward.
TESCAN SEM Solutions for Life Sciences
TESCAN world-class imaging technology delivers complete solutions for researchers in all branches of science. No matter what sample type and size, and what questions are being asked, there is always a dedicated solution available to solve all required tasks. Due to high versatility and customisable design of all TESCAN systems, it is very easy to design and manufacture dedicated instruments suited exactly to the customer’s needs. The available instrumentation encompasses ultrahigh resolution imaging, variable pressure observations, 3D tomographic methods, and complex solutions including correlative light-electron microscopy or cryogenic techniques.
TESCAN SEM Solutions for Earth Sciences and Natural Resources
TESCAN TIMA is a dedicated solution for automated mineralogical analysis requirements in Earth sciences studies as well as industrial mineral processing. Now in its fourth generation, TESCAN TIMA has improved ease of use and delivers ultra-fast analysis to speed the time to trustworthy and reproducible data. Up to four EDS detectors work simultaneously to increase sample processing throughput, while TESCAN’s unique, high sensitivity spectral summing algorithm assures accurate quantification for low abundance elements. And TIMA data is easily correlated with other techniques for mineral characterization.